The LIS-R3 is an advanced characterisation tool for ingot, wafer, cell and minimodule samples. Aimed at TOPCon, PERC, HJT and other cells processes, it is the result of many years of development and continuous improvements. Recent upgrades include compatibility with 24 busbar samples, a new SMU and BC cell measurement. It is an essential tool used by major solar producers and world leading research institutions. Key applications include process improvement, R&D, process debug and root cause analysis, QA & QC. The LIS-R3 offers BT Imaging’s proprietary photoluminescence technology together with series resistance imaging, electroluminescence imaging, Suns-Voc, dark and light IV measurements, advanced cell analysis with implied IV parameters, cell front and bulk separation estimation, QSS-PC injection level dependent lifetime, calibrated lifetime imaging, and more.

The LIS-R MJ is an evolution of BT Imaging's top-of-the-line LIS-R series of production and R&D solutions. Adding to existing LIS-R3 capabilities, the LIS-R MJ adds the ability to image individual sub-cells and interlayer properties in Perovskite-silicon tandem stacks and other complex cell structures. In addition, accompanying proprietary software features reveal and enable resolution of challenges preventing a push for high volume stacked cell production. BT Imaging is excited to continue to evolve this tool with partners to meet novel complex cell production blockers.

Re-designed and reengineered with new hardware and software, this is the ultimate quality inspection unit for wafer inspection systems (WIS) for wafer and cell production lines. Incorporating BT Imaging's proprietary PL Imaging technology, the module is rated up to 10,000 wph. This is the only inline PL imaging unit for raw silicon wafers that is backed by BT imaging’s extensive patent portfolio and market leading inspection algorithms. Typical use cases include wafer rejection, wafer quality sorting by predicted cell efficiency, wafer and cell R&D, and line process improvement. The iLS-W3 is also available in a carrier-loadable offline configuration with accompanying automation.

Backed by high powered machine learning and image processing algorithms, the iLS-C5 is BT Imaging's novel solution to solar production's most complex and efficiency-limiting issues. With PL and AOI imaging capabilities at high quality in a cost-effective and space-effective package, this tool is able to be tailored to assess and address previously uncontrolled high temperature process steps. Initial use cases have included TOPCon metallisation and firing effectiveness quantification and laser process quality tracking. BT Imaging continues to work with users of this tool to advance versatility and utility in any production line.

The iLS-M5 is a next generation tool for module producers and field installers alike. Able to perform on-the-fly module assessment, the iLS-M5 is a promoter of the standardisation of module quality from the beginning of the production line to installation and every step in between. With PL, EL and AOI capabilities, users can easily separate lifetime issues from series resistance defects associated with cell failure and degradation.

The new LIS-R series cell stage includes up to 24 probe rails and is available as part of a selectable BC cell configuration. Probe rails are removable and can easily accomodate less busbars or changing cell designs. The new upgraded cell stage, with enhanced current probe contact and density, allows for improved quality of Rs and EL enabling a more accurate advanced cell analysis via implied IV parameters. In addition, the new cell stage has a significantly better user experience than previous iterations, allowing for speed and ease of use. This upgrade is available with every new LIS-R series tool purchase.